Back to Search Start Over

Analysis of millimeter-wave GaN IMPATT oscillator at elevated temperature.

Authors :
Meng, C. C.
Liao, G. R.
Chen, J. W.
Source :
Microwave & Optical Technology Letters. 11/20/99, Vol. 23 Issue 4, p257-259. 3p. 1 Chart, 5 Graphs.
Publication Year :
1999

Abstract

GaN is a suitable material for millimeter-wave high-power IMPATT oscillators because of its superior electronic properties—high breakdown electric fields and high electron saturation velocity. In this paper, millimeter-wave wurtzite phase and zincblende phase GaN IMPATT oscillators at elevated temperature are analyzed by a Read-type large-signal model. The power density of GaN IMPATT devices at millimeter-wave frequencies is two orders magnitude higher than that of conventional GaAs and Si IMPATT devices. The simulations showed that GaN wurtzite phase p+-n single-drift flat-profile IMPATT oscillators at 300 GHz have an efficiency of 11% and an RF power density of 1.6 MW/cm2 when operated at 800 K. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 23: 257–259, 1999. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
08952477
Volume :
23
Issue :
4
Database :
Academic Search Index
Journal :
Microwave & Optical Technology Letters
Publication Type :
Academic Journal
Accession number :
13449144
Full Text :
https://doi.org/10.1002/(SICI)1098-2760(19991120)23:4<257::AID-MOP20>3.0.CO;2-9