Sintering behavior, microwave dielectric properties of Ca0.66Ti0.66Nd0.34Al0.34O3 ceramics revealed by microstructure and Raman scattering.

Abstract Ca 0.66 Ti 0.66 Nd 0.34 Al 0.34 O 3 (CTNA) ceramics were prepared by solid-state reaction method and their sintering behavior, microwave dielectric properties, and microstructure were investigated. CTNA ceramics were examined by Raman scattering to reveal the correlation of perovskite structure with the microwave properties. It found that the area of peak A 1g (O) stretch mode reflects the quality factor Q × f value in the perovskite materials. This concludes that the oxygen octahedron plays an important role of the material's microwave performance. Sintering temperature affected the unit cell volume and the lattice parameters of the CTNA ceramics, the grain size distribution, the Gibbs free energy, the thermal expansion coefficient (CTE), and the dielectric properties (ε r , Q × f , τ f). The samples sintered at 1500 °C displayed the best dielectric constant and Q × f , as 44.94 and 41922.22 GHz, respectively. Highlights • The CTNA ceramics were sintered at different temperatures were investigated. • The thermal analysis detailed description of the stages of sintering process. • The unit cell volume is affected by the sintering temperature was confirmed by XRD. • Raman to reveal the correlation of structure with the microwave properties. • Relationship between grain size, Gibbs free energy, CTE, and dielectric properties. [ABSTRACT FROM AUTHOR]