Back to Search
Start Over
Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution.
- Source :
-
IEEE Transactions on Information Theory . May2019, Vol. 65 Issue 5, p3080-3096. 17p. - Publication Year :
- 2019
-
Abstract
- This paper develops a new family of estimators, the minimum density power divergence estimators (MDPDEs), for the parameters of the one-shot device model as well as a new family of test statistics, Z-type test statistics based on MDPDEs, for testing the corresponding model parameters. The family of MDPDEs contains as a particular case the maximum likelihood estimator (MLE) considered in Balakrishnan and Ling (2012). Through a simulation study, it is shown that some MDPDEs have a better behavior than the MLE in terms of robustness. At the same time, it can be seen that some Z-type tests based on MDPDEs have a better behavior than the classical Z-test statistic in terms of robustness, as well. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189448
- Volume :
- 65
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Information Theory
- Publication Type :
- Academic Journal
- Accession number :
- 136101312
- Full Text :
- https://doi.org/10.1109/TIT.2019.2903244