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Semiconductors: X‐Ray Writing of Metallic Conductivity and Oxygen Vacancies at Silicon/SrTiO3 Interfaces (Adv. Funct. Mater. 25/2019).
- Source :
-
Advanced Functional Materials . 6/21/2019, Vol. 29 Issue 25, pN.PAG-N.PAG. 1p. - Publication Year :
- 2019
- Subjects :
- *X-rays
*SEMICONDUCTORS
*PHOTOELECTRON spectroscopy
*OXYGEN
Subjects
Details
- Language :
- English
- ISSN :
- 1616301X
- Volume :
- 29
- Issue :
- 25
- Database :
- Academic Search Index
- Journal :
- Advanced Functional Materials
- Publication Type :
- Academic Journal
- Accession number :
- 137069815
- Full Text :
- https://doi.org/10.1002/adfm.201900645