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ASM GaN: Industry Standard Model for GaN RF and Power Devices—Part 1: DC, CV, and RF Model.

Authors :
Khandelwal, Sourabh
Chauhan, Yogesh Singh
Fjeldly, Tor A.
Ghosh, Sudip
Pampori, Ahtisham
Mahajan, Dhawal
Dangi, Raghvendra
Ahsan, Sheikh Aamir
Source :
IEEE Transactions on Electron Devices. Jan2019, Vol. 66 Issue 1, p80-86. 7p.
Publication Year :
2019

Abstract

We present the latest developments in Advance SPICE Model for GaN (ASM GaN) HEMTs in this paper. The ASM GaN model has been recently selected as an industry-standard compact model for GaN radio frequency (RF) and power devices. The core surface-potential calculation and the modeling of real device effects in this model are presented. We discuss the details of the nonlinear access region model and enhancement in this model to include a physical dependence on barrier thickness. We also present the novel model feature of configurable field-plate modeling and discuss the extraction procedure for the same. New results with the ASM GaN model on high-frequency and enhancement-mode GaN power devices are also presented. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
66
Issue :
1
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
137215118
Full Text :
https://doi.org/10.1109/TED.2018.2867874