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Extraction of Packaged GaN Power Transistors Parasitics Using S-Parameters.
- Source :
-
IEEE Transactions on Electron Devices . Jun2019, Vol. 66 Issue 6, p2583-2588. 6p. - Publication Year :
- 2019
-
Abstract
- In order to better predict the high-frequency switching operation of transistors in power converters, parasitic elements of these devices such as resistances, inductances, and capacitances must be accurately evaluated. This paper reports on the characterization of a gallium nitride (GaN) packaged power transistor using S-parameters in order to extract the device parasitics. Because the transistor is packaged, a calibration technique is carried out using specific test fixtures designed on FR4 printed circuit board (PCB) in order to get the S-parameters in the transistor plane from the measurement. The proposed method is suitable for a wide range of power devices. In this paper, it is applied to an enhancement-mode GaN high electron mobility transistor (HEMT). The impact of junction temperature on drain and source resistances is also evaluated. According to characterization results, equation-based modeling is proposed for the nonlinear parameters. The extracted parasitic elements are compared with reference values given by the device manufacturer. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 66
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 137270816
- Full Text :
- https://doi.org/10.1109/TED.2019.2909152