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A Global Correction Process for Flat Optics With Patterned Polishing Pad.

Authors :
Weisi Li
Ping Zhou
Zhichao Geng
Ying Yan
Dongming Guo
Source :
Journal of Manufacturing Science & Engineering. Sep2019, Vol. 141 Issue 9, p1-10. 10p.
Publication Year :
2019

Abstract

To improve the efficiency of flat optics fabrication, a global correction method with the patterned polishing pad is developed in this paper. Through creating grooves on a polishing pad, the contact pressure distribution on the optics surface can be adjusted to change the material removal rate (MRR) distribution during polishing. Using the patterned pad, the selective removal ability of the polishing process is greatly enhanced. The predictability and stability of the MRR distribution are the preconditions to efficiently implement the proposed global correction method. Relying on the MRR distribution prediction method proposed and validated in this paper, the pad pattern can be designed based on the original surface figure of the workpieces. The designed groove pattern is created on the polishing pad using the custom-developed equipment. Then, the optical glass is polished on the designed pad with the optimized polishing time. A flat optical glass sample (F 100 mm) is polished with the global correction method to show its feasibility and advantage. The correction instance shows that the peak-to-valley (PV) value of the surface profile (with 3 mm edge exclusion) dropped from 1.17 µm to 0.2 µm in 14 min using a polyurethane pad with two ring grooves. Comparing with the conventional polishing process, which usually takes hours or days, the global correction method proposed in this paper can improve the efficiency of the optics manufacturing significantly. [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
*GRINDING & polishing
*OPTICS

Details

Language :
English
ISSN :
10871357
Volume :
141
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Manufacturing Science & Engineering
Publication Type :
Academic Journal
Accession number :
137920475
Full Text :
https://doi.org/10.1115/1.4044250