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An Enhanced Strategy to Inhibit Commutation Failure in Line-Commutated Converters.

Authors :
Mirsaeidi, Sohrab
Dong, Xinzhou
Source :
IEEE Transactions on Industrial Electronics. Jan2020, Vol. 67 Issue 1, p340-349. 10p.
Publication Year :
2020

Abstract

Failure of the commutation process is a serious malfunction in line-commutated high-voltage direct current (HVdc) converters, which mainly occurs due to inverter ac faults and may lead to outage of the HVdc system. In this paper, an improved strategy is developed that functions based on the SIEMENS HVdc control system under normal conditions and switches to a designed commutation failure inhibition module (CFIM) during an inverter ac fault. From the response speed point of view, since the designed CFIM does not require any proportional-integral controller, the inverter control system has a quick performance in prevention of the commutation failure. This is achieved by direct measurement of the overlap area using the waveforms of the valves anode–cathode and commuting voltages. In addition, from the accuracy aspect, the proposed method has a superior performance in comparison with the existing strategies. It is because of the fact that by direct measurement of the overlap area, variations of both direct current and the commutation inductance are considered, and hence, the unnecessary increase of the inverter reactive power consumption during the fault and the repetitive commutation failures are prevented. The practical performance and feasibility of the proposed strategy is validated through the laboratory testing, using the real-time Opal-RT hardware prototyping platform. The experimental results demonstrate that the proposed strategy can effectively inhibit the commutation failure or repetitive commutation failures under different fault types by considering the lowest possible reactive power consumption. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
02780046
Volume :
67
Issue :
1
Database :
Academic Search Index
Journal :
IEEE Transactions on Industrial Electronics
Publication Type :
Academic Journal
Accession number :
138481390
Full Text :
https://doi.org/10.1109/TIE.2019.2896328