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Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry.
- Source :
-
IEEE Transactions on Electron Devices . Sep2019, Vol. 66 Issue 9, p3973-3977. 5p. - Publication Year :
- 2019
-
Abstract
- In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved. [ABSTRACT FROM AUTHOR]
- Subjects :
- *QUANTUM Hall effect
*GEOMETRY
Subjects
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 66
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 138938142
- Full Text :
- https://doi.org/10.1109/TED.2019.2926684