Cite
Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers.
MLA
Baeg, Sanghyeon, et al. “Correctable and Uncorrectable Errors Using Large Scale DRAM DIMMs in Replacement Network Servers.” Microelectronics Reliability, vol. 99, Aug. 2019, pp. 104–12. EBSCOhost, https://doi.org/10.1016/j.microrel.2019.05.008.
APA
Baeg, S., Qasim, M., Kwon, J., Li, T., Gupta, N., Wen, S.-J., & Kolli, S. (2019). Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers. Microelectronics Reliability, 99, 104–112. https://doi.org/10.1016/j.microrel.2019.05.008
Chicago
Baeg, Sanghyeon, Mirza Qasim, Junhyeong Kwon, Tan Li, Nilay Gupta, Shi-Jie Wen, and Satyadev Kolli. 2019. “Correctable and Uncorrectable Errors Using Large Scale DRAM DIMMs in Replacement Network Servers.” Microelectronics Reliability 99 (August): 104–12. doi:10.1016/j.microrel.2019.05.008.