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Oxidation characteristics of commercial copper-based lead frame surface and the bonding with epoxy molding compounds.

Authors :
Chao, Shih-Chieh
Huang, Wei-Chen
Liu, Jen-Hsiang
Song, Jenn-Ming
Shen, Po-Yen
Huang, Chi-Lin
Hung, Lung-Tang
Chang, Chin-Huang
Source :
Microelectronics Reliability. Aug2019, Vol. 99, p161-167. 7p.
Publication Year :
2019

Abstract

This study investigates surface oxidized layers of Cu-Fe-Zn-P (C194) and Cu-Ni-Si-Mg (C7025) lead frames under different oxidation conditions and their influence on the adhesion of epoxy molding compounds with lead frames. Micro-etching and electroplating are adopted to roughen the surface. Isothermal heat treatments which simulate molding and curing processes, as well as high temperature aging, are carried out to oxidize lead frame surface. According to the absorption peaks of FTIR (Fourier transform infrared spectroscopy) spectra, the topmost surface of the oxide layer can be easily identified. In combination with the reduction potential and time obtained from the coulometric reduction test, the variation of oxide phases along the through-thickness direction can also be revealed. Experimental results show that in addition to surface roughness, surface oxides and their thickness play more important roles in the interfacial strength between lead frames and epoxy molding compounds. In the case of the surface with one single Cu 2 O layer, an increase in oxide layer results in a decrease in bonding strength. Once the topmost surface forms CuO, the bonding strength could be enhanced due to a greater surface energy. Compared with electroplated C194, the thinner surface oxide layer and thus better performance in adhesion strength for electroplated C7025 can be ascribed to the immersion Ag surface treatment. • Surface oxidation layer of commercial lead frames was studied. • FTIR and electrochemical mean explored oxide on lead frame surface and underneath. • CuO formation leads to a greater EMC adhesion because of high surface energy. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00262714
Volume :
99
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
139387576
Full Text :
https://doi.org/10.1016/j.microrel.2019.05.020