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ISTFA 2019 EXHIBITORS SHOWCASES.

Source :
Electronic Device Failure Analysis. Nov2019, Vol. 21 Issue 4, p41-41. 1p.
Publication Year :
2019

Abstract

The article evaluates several products that to be exhibited in International Symposium For Testing And Failure Analysis in Portland on November, 2019; including optical failure analysis tools by Checkpoint Technologies, Evactron De-Contaminators by XEI Scientific, and Tessent Diagnosis software.

Details

Language :
English
ISSN :
15370755
Volume :
21
Issue :
4
Database :
Academic Search Index
Journal :
Electronic Device Failure Analysis
Publication Type :
Academic Journal
Accession number :
139419931