Back to Search
Start Over
Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics.
- Source :
-
Journal of Synchrotron Radiation . Jul2004, Vol. 11 Issue 4, p343-346. 4p. 2 Black and White Photographs, 1 Chart, 15 Graphs. - Publication Year :
- 2004
-
Abstract
- A new figure correction method has been applied in order to fabricate an elliptical mirror to realize a one-dimensionally diverging X-ray beam having high image quality. Mutual relations between figure errors and intensity uniformities of diverging X-ray beams have also been investigated using a wave-optical simulator and indicate that figure errors in relatively short spatial wavelength ranges lead to high-contrast interference fringes. By using a microstitching interferometer and elastic emission machining, figure correction of an elliptical mirror with a lateral resolution close to 0.1 mm was carried out. A one-dimensional diverging X-ray obtained using the fabricated mirror was observed at SPring-8 and evaluated to have a sufficiently flat intensity distribution. [ABSTRACT FROM AUTHOR]
- Subjects :
- *X-ray microscopes
*MIRRORS
*OPTICS
*INTERFEROMETERS
*COHERENCE (Optics)
*X-rays
Subjects
Details
- Language :
- English
- ISSN :
- 09090495
- Volume :
- 11
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Journal of Synchrotron Radiation
- Publication Type :
- Academic Journal
- Accession number :
- 13951086
- Full Text :
- https://doi.org/10.1107/S090904950401283X