Back to Search
Start Over
Reliability evaluation of a 0.25 μm SiGe technology for space applications.
- Source :
-
Microelectronics Reliability . Sep2019, Vol. 100, pN.PAG-N.PAG. 1p. - Publication Year :
- 2019
-
Abstract
- This article presents a reliability evaluation of the SiGe SGB25 technology from the European foundry IHP. We propose in this paper a methodology allowing to take into account reliability space requirements. For that, specific test vehicles have been designed and dedicated test sequences have been defined. The final goal is to define a MMIC (Monolithic Microwave Integrated Circuit) safe operating area in terms of static and dynamic electrical constraints. Emphasis will be given to the influence of the degradation modes on noise parameters. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00262714
- Volume :
- 100
- Database :
- Academic Search Index
- Journal :
- Microelectronics Reliability
- Publication Type :
- Academic Journal
- Accession number :
- 139562592
- Full Text :
- https://doi.org/10.1016/j.microrel.2019.113480