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Secondary ion mass spectrometry to verify the implantation of magnetic ions in nanodiamonds.

Authors :
Lin, Bo-Rong
Wang, Chiung-Chi
Chen, Chien-Hsu
Kunuku, Srinivasu
Hsiao, Tung-Yuan
Yu, Hung-Kai
Chen, Tzung-Yuang
Chang, Yu-Jen
Liao, Li-Chuan
Chang, Chun-Hsiang
Chen, Fang-Hsin
Niu, Huan
Lee, Chien-Ping
Source :
Journal of Applied Physics. 11/7/2019, Vol. 126 Issue 17, pN.PAG-N.PAG. 6p. 1 Diagram, 3 Graphs.
Publication Year :
2019

Abstract

Ion implantation is used to create nanodiamonds (NDs) with embedded magnetic ions for use in a wide range of biological and medical applications; however, the effectiveness of this process depends heavily on separating magnetic NDs from nonmagnetic ones. In this study, we use secondary ion mass spectrometry to verify the implantation of magnetic ions in NDs and the success of separation. When applied to a series of NDs with embedded iron or manganese ions, the sorting tool used in this study proved highly effective in selecting magnetic NDs. Besides, multienergy ion implantation and precise thickness control of NDs coating on the silicon wafer were suggested to improve this technology. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
126
Issue :
17
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
139565686
Full Text :
https://doi.org/10.1063/1.5117342