Cite
Special Issue on Reliability.
MLA
Mahapatra, Souvik, et al. “Special Issue on Reliability.” IEEE Transactions on Electron Devices, vol. 66, no. 11, Nov. 2019, pp. 4497–503. EBSCOhost, https://doi.org/10.1109/TED.2019.2943987.
APA
Mahapatra, S., Chen, K. J., Kaczer, B., Pancheri, L., Rosenbaum, E., Mouli, C., Wong, H., Kerber, A., Monzio Compagnoni, C., Koval, R., Meneghesso, G., Sheridan, D., Ramey, S., Wang, R., & Stathis, J. (2019). Special Issue on Reliability. IEEE Transactions on Electron Devices, 66(11), 4497–4503. https://doi.org/10.1109/TED.2019.2943987
Chicago
Mahapatra, Souvik, Kevin J. Chen, Ben Kaczer, Lucio Pancheri, Elyse Rosenbaum, Chandra Mouli, Hei Wong, et al. 2019. “Special Issue on Reliability.” IEEE Transactions on Electron Devices 66 (11): 4497–4503. doi:10.1109/TED.2019.2943987.