Microwave dielectric properties of SrLa[Ga1−x(Mg0.5Ti0.5)x]O4 and SrLa[Ga1−x(Zn0.5Ti0.5)x]O4 (x = 0.2‐0.8) ceramics

SrLa[Ga1−x(R0.5Ti0.5)x]O4 (R = Mg, Zn) ceramics were prepared by a standard solid state sintering method. The single‐phase ceramics with K2NiF4‐type layered perovskite structure and I4/mmm space group were obtained, indicating that SrLa(R0.5Ti0.5) and SrLaGaO4 can form the unlimited solid solutions. With increasing x for R = Mg and Zn, εr increases monotonously, the Qf value first increases and then decreases, while τf increases from a negative to a positive value. The optimized microwave dielectric properties were obtained as following: εr = 23.3, Qf = 89 400 GHz, τf = −0.8 ppm/°C for SrLa[Ga0.6(Mg0.5Ti0.5)0.4]O4 and εr = 23.3, Qf = 76 200 GHz, τf = 0.2 ppm/°C for SrLa[Ga0.7(Zn0.5Ti0.5)0.3]O4, indicating that the present solid solution ceramics are the promising candidates as microwave resonator materials for the telecommunication applications. [ABSTRACT FROM AUTHOR]