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Effect of Evanescent Waves on the Dark Current of Thermophotovoltaic Cells.

Authors :
Feng, Dudong
Tervo, Eric J.
Yee, Shannon K.
Zhang, Zhuomin M.
Source :
Nanoscale & Microscale Thermophysical Engineering. 2020, Vol. 24 Issue 1, p1-19. 19p.
Publication Year :
2020

Abstract

The output power of thermophotovoltaic (TPV) cells may be greatly increased when the gap between the emitter and cell is reduced to submicron distances (near-field regime), at which photon tunneling due to evanescent waves becomes important. Accurate modeling of TPV cells in these conditions is crucial for the design and optimization of near-field TPV systems. The conventional or standard modeling method uses the summation of the dark current and the short-circuit current, while the direct method applies the photon chemical potential. It has been shown that the two methods are linked through a modification of the direct method using Wien's approximation. By contrasting different modeling approaches, we quantitatively analyze the effects of evanescent waves on the TPV cell performance parameters, especially the dark current, for different emitter and cell materials in the near-field regime. Our results show that the saturation current by radiative recombination is strongly affected by evanescent waves and the bandgap energy. The current-voltage characteristics calculated by different modeling methods are displayed to demonstrate that a constant saturation current typically used in the standard method could cause substantial error in the near-field regime. For a TPV system with an emitter operating at relatively low temperatures, we show that it is necessary to include the photon chemical potential in the computation of the net radiative heat transfer between the emitter and receiver. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
15567265
Volume :
24
Issue :
1
Database :
Academic Search Index
Journal :
Nanoscale & Microscale Thermophysical Engineering
Publication Type :
Academic Journal
Accession number :
141822049
Full Text :
https://doi.org/10.1080/15567265.2019.1683106