Deep Feature Fusion for IRIS Based on Industrial Biometric Engineering.

Students attendance is one of the primary and most vital things that is used in all the schools. Schools have numerous systems for taking attendance. Some of them use manual attendance, while some of them taking attendance by making use of the bar codes embedded in the student identity cards. Though various systems are been used still it needs ample development to make it more efficient with minimal time consumption. In this paper, we have proposed a model for taking the attendance of the students by making use of biometric attendance systems that are intended to make use of WFT (Wireless Fingerprint System). The system proposed in the paper makes use of the unique Aadhaar number that is given to all the citizens of India. The student biometric is matched with their respective Aadhaar number. By making use of the proposed system it is not only useful for attendance tracking but also useful for the government to provide scholarships or education fees waiver to the deserved students. The system makes use of local normalization, second stage enhancement and matching modules to make it more efficient when compared to other traditional attendance systems. [ABSTRACT FROM AUTHOR]