Cite
A single-ion monitor based on coincident measurement of secondary electrons for single event effect research.
MLA
Jin, Ying, et al. “A Single-Ion Monitor Based on Coincident Measurement of Secondary Electrons for Single Event Effect Research.” Review of Scientific Instruments, vol. 91, no. 4, Apr. 2020, pp. 1–10. EBSCOhost, https://doi.org/10.1063/1.5145223.
APA
Jin, Y., Zhang, Y., Liu, J., Yu, D., Wang, H., Meng, J., Guo, T., Hui, X., & Li, X. (2020). A single-ion monitor based on coincident measurement of secondary electrons for single event effect research. Review of Scientific Instruments, 91(4), 1–10. https://doi.org/10.1063/1.5145223
Chicago
Jin, Ying, Yuezhao Zhang, Junliang Liu, Deyang Yu, Hui Wang, Jun Meng, Tao Guo, Xinfei Hui, and Xiaoxiao Li. 2020. “A Single-Ion Monitor Based on Coincident Measurement of Secondary Electrons for Single Event Effect Research.” Review of Scientific Instruments 91 (4): 1–10. doi:10.1063/1.5145223.