X-ray study of strain and composition of Si/Ge0.85Si0.15 (111) islands grown in Volmer-Weber mode.

MLA

Malachias, A., et al. “X-Ray Study of Strain and Composition of Si/Ge0.85Si0.15 (111) Islands Grown in Volmer-Weber Mode.” Journal of Applied Physics, vol. 96, no. 6, Sept. 2004, pp. 3234–38. EBSCOhost, https://doi.org/10.1063/1.1777396.

APA

Malachias, A., Magalhães-Paniago, R., Kycia, S., & Cahill, D. G. (2004). X-ray study of strain and composition of Si/Ge0.85Si0.15 (111) islands grown in Volmer-Weber mode. Journal of Applied Physics, 96(6), 3234–3238. https://doi.org/10.1063/1.1777396

Chicago

Malachias, A., R. Magalhães-Paniago, S. Kycia, and David G. Cahill. 2004. “X-Ray Study of Strain and Composition of Si/Ge0.85Si0.15 (111) Islands Grown in Volmer-Weber Mode.” Journal of Applied Physics 96 (6): 3234–38. doi:10.1063/1.1777396.