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Reverse Low-Power Broadside Tests.
- Source :
-
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems . Mar2020, Vol. 39 Issue 3, p742-746. 5p. - Publication Year :
- 2020
-
Abstract
- This paper defines a new type of a low-power broadside test, called a reverse low-power broadside test, whose application requires design-for-testability logic. The unique feature of a reverse low-power broadside test is that it duplicates the switching activity during the second functional capture cycle of a given low-power broadside test, except that signal-transitions are reversed. Thus, the switching activity of a reverse low-power broadside test duplicates that of a low-power broadside test in every subcircuit and on every line individually. In addition, the reversed test detects different faults, and can thus increase the fault coverage of a low-power broadside test set. This paper studies the ability of reverse low-power broadside tests to increase the transition fault coverage in benchmark circuits considering functional broadside tests as well as low-power broadside tests that are not functional. [ABSTRACT FROM AUTHOR]
- Subjects :
- *LOGIC circuits
*INTEGRATED circuit design
*LOGIC circuits testing
Subjects
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 39
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
- Publication Type :
- Academic Journal
- Accession number :
- 143313101
- Full Text :
- https://doi.org/10.1109/TCAD.2019.2894675