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Vision system for surface roughness and surface defect measurement.

Authors :
Guo, Ruipeng
Bian, Dongliang
Source :
Optical Engineering. Jun2020, Vol. 59 Issue 6, p64103-64103. 1p.
Publication Year :
2020

Abstract

A vision system for surface roughness and surface defect measurement is introduced. This system applies two cameras for capturing the laser pattern and scattering images simultaneously. Three features are extracted from the scattering images to characterize the surface roughness. The light pattern images are processed to locate the defect and compute the size of the defect. Some experiments have been performed, and the experimental results verify the feasibility of the method. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00913286
Volume :
59
Issue :
6
Database :
Academic Search Index
Journal :
Optical Engineering
Publication Type :
Academic Journal
Accession number :
144499647
Full Text :
https://doi.org/10.1117/1.OE.58.6.064103