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Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering.

Authors :
De Hoe, Guilhem X.
Mao, Jun
Jiang, Zhang
Darling, Seth B.
Tirrell, Matthew V.
Chen, Wei
Source :
Synchrotron Radiation News. Jul-Aug2020, Vol. 33 Issue 4, p24-30. 7p.
Publication Year :
2020

Subjects

Subjects :
*X-ray scattering
*X-ray absorption near edge structure
*SOFT X rays
*POLYMERS
*MATERIALS science

Details

Language :
English
ISSN :
08940886
Volume :
33
Issue :
4
Database :
Academic Search Index
Journal :
Synchrotron Radiation News
Publication Type :
Academic Journal
Accession number :
145323426
Full Text :
https://doi.org/10.1080/08940886.2020.1784698
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