Back to Search
Start Over
Exchange bias effect in Fe/LaAlO3: An interface induced effect.
- Source :
-
Journal of Alloys & Compounds . Dec2020, Vol. 849, pN.PAG-N.PAG. 1p. - Publication Year :
- 2020
-
Abstract
- The present work reports the appearance of the exchange bias (EB) effect at low temperatures in epitaxial Fe thin film deposited on single crystalline LaAlO 3 (001) substrate. The observed EB effect vanishes around 30 K indicating that it could be due to the formation of antiferromagnetic FeO layer at the interface between Fe and LaAlO 3 substrate. The EB in Fe/LaAlO 3 (001) is further substantiated by comparing the observations with polycrystalline Fe film deposited on silicon substrate, kept adjacent to LaAlO 3 substrate during the deposition. Magnetic microstructure measured by Kerr microscopy corroborates the structural data of Fe film i.e., cubic four-fold anisotropy and isotropic nature for Fe film deposited on LaAlO 3 and silicon substrates, respectively. Further, low temperature Kerr microscopy results reveal that the magnetization reversal process significantly gets modified due to the induced unidirectional anisotropy as a consequence of FeO layer formation at Fe/LaAlO 3 interface. • Magnetic microstructural evidence for the cubic anisotropy in Fe/LaAlO 3. • Appearance of exchange bias in epitaxial Fe/LaAlO 3 thin film. • Change in magnetization reversal due to induced unidirectional anisotropy. [ABSTRACT FROM AUTHOR]
- Subjects :
- *CRYOMICROSCOPY
*MAGNETIZATION reversal
*THIN films
*SILICON films
*LOW temperatures
Subjects
Details
- Language :
- English
- ISSN :
- 09258388
- Volume :
- 849
- Database :
- Academic Search Index
- Journal :
- Journal of Alloys & Compounds
- Publication Type :
- Academic Journal
- Accession number :
- 145759918
- Full Text :
- https://doi.org/10.1016/j.jallcom.2020.156484