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Parallel SEN: a new approach to improve the reliability of shuffle-exchange network.

Authors :
Abedini, Roshanak
Ravanmehr, Reza
Source :
Journal of Supercomputing. Dec2020, Vol. 76 Issue 12, p10319-10353. 35p.
Publication Year :
2020

Abstract

In the past few decades, the demand for high-performance computing has been increasingly growing. These systems usually employ many processing elements working together via interconnection networks to solve complicated problems. Due to the efficiency and cost productivity, multistage interconnection networks (MINs) are recommended for use in such systems. At the same time, shuffle-exchange networks (SENs) have extensively been used as a suitable solution to multistage interconnection networks, given the size of their switching elements and simple configurations. In this paper, parallel SEN (PSEN) is proposed to enhance the reliability of these networks. Moreover, PSENs with one and two more stages (PSEN+ and PSEN+2) are utilized to optimize the reliability factor. The reliability analysis of the proposed network is performed through the reliability block diagram. According to the evaluation results, PSEN achieved higher reliability compared to SEN in different aspects of reliability, such as terminal, broadcast, and network. The proposed network also improves the cost-effectiveness in comparison with other MINs. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09208542
Volume :
76
Issue :
12
Database :
Academic Search Index
Journal :
Journal of Supercomputing
Publication Type :
Academic Journal
Accession number :
146367688
Full Text :
https://doi.org/10.1007/s11227-020-03252-8