Investigation of the Temperature Dependence of Hot-Carrier Degradation in Si MOSFETs Using Spectroscopic Charge Pumping.

MLA

Ruch, Bernhard, et al. “Investigation of the Temperature Dependence of Hot-Carrier Degradation in Si MOSFETs Using Spectroscopic Charge Pumping.” IEEE Transactions on Electron Devices, vol. 67, no. 10, Oct. 2020, pp. 4092–98. EBSCOhost, https://doi.org/10.1109/TED.2020.3018091.

APA

Ruch, B., Pobegen, G., & Grasser, T. (2020). Investigation of the Temperature Dependence of Hot-Carrier Degradation in Si MOSFETs Using Spectroscopic Charge Pumping. IEEE Transactions on Electron Devices, 67(10), 4092–4098. https://doi.org/10.1109/TED.2020.3018091

Chicago

Ruch, Bernhard, Gregor Pobegen, and Tibor Grasser. 2020. “Investigation of the Temperature Dependence of Hot-Carrier Degradation in Si MOSFETs Using Spectroscopic Charge Pumping.” IEEE Transactions on Electron Devices 67 (10): 4092–98. doi:10.1109/TED.2020.3018091.