Cite
Measurement uncertainty limit analysis of biased estimators in RFID multiple tags system.
MLA
Yu, Yinshan, et al. “Measurement Uncertainty Limit Analysis of Biased Estimators in RFID Multiple Tags System.” IET Science, Measurement & Technology (Wiley-Blackwell), vol. 10, no. 5, Aug. 2016, pp. 449–55. EBSCOhost, https://doi.org/10.1049/iet-smt.2015.0202.
APA
Yu, Y., Yu, X., Zhao, Z., Liu, J., & Wang, D. (2016). Measurement uncertainty limit analysis of biased estimators in RFID multiple tags system. IET Science, Measurement & Technology (Wiley-Blackwell), 10(5), 449–455. https://doi.org/10.1049/iet-smt.2015.0202
Chicago
Yu, Yinshan, Xiaolei Yu, Zhimin Zhao, Jialing Liu, and Donghua Wang. 2016. “Measurement Uncertainty Limit Analysis of Biased Estimators in RFID Multiple Tags System.” IET Science, Measurement & Technology (Wiley-Blackwell) 10 (5): 449–55. doi:10.1049/iet-smt.2015.0202.