Cite
High‐quality depth up‐sampling based on multi‐scale SLIC.
MLA
Qiao, Yiguo, et al. “High‐quality Depth Up‐sampling Based on Multi‐scale SLIC.” Electronics Letters (Wiley-Blackwell), vol. 54, no. 7, Apr. 2018, pp. 494–96. EBSCOhost, https://doi.org/10.1049/el.2017.4393.
APA
Qiao, Y., Jiao, L., & Hou, B. (2018). High‐quality depth up‐sampling based on multi‐scale SLIC. Electronics Letters (Wiley-Blackwell), 54(7), 494–496. https://doi.org/10.1049/el.2017.4393
Chicago
Qiao, Yiguo, Licheng Jiao, and Biao Hou. 2018. “High‐quality Depth Up‐sampling Based on Multi‐scale SLIC.” Electronics Letters (Wiley-Blackwell) 54 (7): 494–96. doi:10.1049/el.2017.4393.