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Ion-beam-induced embedded nanostructures and nanoscale mixing.

Authors :
Satpati, B.
Satyam, P. V.
Som, T.
Dev, B. N.
Source :
Journal of Applied Physics. 11/1/2004, Vol. 96 Issue 9, p5212-5216. 5p. 2 Black and White Photographs, 1 Graph.
Publication Year :
2004

Abstract

Megaelectron volts ion-induced effects for discontinuous gold nanoislands and for continuous gold films on silicon substrate have been studied. Irradiation was carried out with 1.5 MeV Au2+ ions at room temperature to various fluences. Cross-sectional transmission electron microscopy and Rutherford backscattering spectrometry are used to study the ion-beam mixing in Au/Si systems. At a fluence of 1×1014 ions cm-2, a material push-in effect and a metastable Au-Si phase formation have been observed for Au nanoislands, while no push in or mixing has been observed for the case of continuous films. The mixed phase of Au-Si system is found to be crystalline in nature. The material push- in and ion-beam mixing effects that are observed in case of nanoislands appear to be due to combined effect of capillary driving force, ion-induced viscous flow, and ion-induced energy spike effects. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
96
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
14909561
Full Text :
https://doi.org/10.1063/1.1794899