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Burstein-Moss shift in impurity-compensated bulk Ga1-xInxSb substrates.

Authors :
Pino, R.
Ko, Y.
Dutta, P. S.
Guha, Shekhar
Gonzalez, Leonel P.
Source :
Journal of Applied Physics. 11/1/2004, Vol. 96 Issue 9, p5349-5352. 4p. 3 Graphs.
Publication Year :
2004

Abstract

The optical and electrical properties of tellurium- (Te) compensated Ga1-xInxSb bulk crystals with alloy compositions ranging from x=0.37 to x=0.98 have been investigated. It has been observed that the Burstein-Moss shift plays an important role in the optical properties of Ga1-xInxSb crystals for the alloy compositions greater than x=0.5 and net donor concentrations in the 2.9×1017 to 2.6×1018 cm-3 range at 300 K. A good agreement has been obtained between the theory and experimental observations. Furthermore, electrical characterizations at 300 and 77 K show that Te compensates the native defects in Ga1-xInxSb, irrespective of the alloy composition. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
96
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
14909573
Full Text :
https://doi.org/10.1063/1.1796538