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Burstein-Moss shift in impurity-compensated bulk Ga1-xInxSb substrates.
- Source :
-
Journal of Applied Physics . 11/1/2004, Vol. 96 Issue 9, p5349-5352. 4p. 3 Graphs. - Publication Year :
- 2004
-
Abstract
- The optical and electrical properties of tellurium- (Te) compensated Ga1-xInxSb bulk crystals with alloy compositions ranging from x=0.37 to x=0.98 have been investigated. It has been observed that the Burstein-Moss shift plays an important role in the optical properties of Ga1-xInxSb crystals for the alloy compositions greater than x=0.5 and net donor concentrations in the 2.9×1017 to 2.6×1018 cm-3 range at 300 K. A good agreement has been obtained between the theory and experimental observations. Furthermore, electrical characterizations at 300 and 77 K show that Te compensates the native defects in Ga1-xInxSb, irrespective of the alloy composition. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 96
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 14909573
- Full Text :
- https://doi.org/10.1063/1.1796538