Back to Search Start Over

Top-down nanofabrication approaches toward single-digit-nanometer scale structures.

Authors :
Oh, Dong Kyo
Jeong, Heonyeong
Kim, Joohoon
Kim, Yeseul
Kim, Inki
Ok, Jong G.
Rho, Junsuk
Source :
Journal of Mechanical Science & Technology. Mar2021, Vol. 35 Issue 3, p837-859. 23p.
Publication Year :
2021

Abstract

Sub-10 nm nanostructures have received broad interest for their intriguing nano-optical phenomena, such as extreme field localization and enhancement, quantum tunneling effect, and strong coupling. The range of cutting-edge applications based on single-digit-nanometer scale structures has expanded with the development of nanofabrication technologies. However, challenges still remain in overcoming fabrication limits, such as scalability, controllability, and reproducibility for further practical applications of the sub-10 nm nanostructures. In this review, we discuss the recent advances in top-down nanofabrication methods towards single-digit-nanometer-sized structures. The well-known examples include electron beam lithography (EBL), focused ion beam (FIB) milling or lithography, atomic layer deposition (ALD), and other unconventional techniques to obtain sub-10 nm nanostructures or nanogaps. We discuss state-of-the-art applications for sub-10 nm nanophotonics such as optical trapping or sensing devices, imaging devices, and electronic devices. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
1738494X
Volume :
35
Issue :
3
Database :
Academic Search Index
Journal :
Journal of Mechanical Science & Technology
Publication Type :
Academic Journal
Accession number :
149150636
Full Text :
https://doi.org/10.1007/s12206-021-0243-7