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A method for fault recognition in the last three rounds of Advanced Encryption Standard.

Authors :
Jiang, Huilong
Zhu, Xiang
Pang, Jinfeng
Liu, Zhipeng
Han, Jianwei
Li, Yue
Source :
Electronics Letters (Wiley-Blackwell). Jun2021, Vol. 57 Issue 13, p511-513. 3p.
Publication Year :
2021

Abstract

A large number of studies are there for Advanced Encryption Standard (AES) fault attack analysis, but less for fault recognition. This paper presents a recognition method for single‐byte fault which is induced in the last three rounds of AES. Studying the differential characteristics of Sbox, the single byte fault induced in ninth round or tenth round will be identified respectively with 9.3 and 9.1 ciphertexts. For the fault induced in eighth round, the fault value can be obtained with 188.5 ciphertexts by analyzing the differential features of two Sboxes and MixColumns. As an auxiliary means for fault attacks, this method is used to realize the byte or bit level physical positioning of confidential data in the encryption chip, which is beneficial to reduce the blindness of the attacker's experiments and obtain the sensitive area of fault attack. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00135194
Volume :
57
Issue :
13
Database :
Academic Search Index
Journal :
Electronics Letters (Wiley-Blackwell)
Publication Type :
Academic Journal
Accession number :
150967414
Full Text :
https://doi.org/10.1049/ell2.12188