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Phase stability and electrical properties of (Bi0.925La0.075)2Ti2O7 thin films by chemical solution deposition.
- Source :
-
Journal of Materials Science . May2004, Vol. 39 Issue 9, p3171-3173. 3p. 2 Graphs. - Publication Year :
- 2004
-
Abstract
- Discusses the phase stability and electrical properties of bismuth titanium oxide thin films by chemical solution deposition. Ferroelectric material with properties for optical memory and piezoelectric devices; Gate insulating material in advanced metal-oxide-semiconductor transistors; Phase becomes unstable at high temperature; Mixed-phase structure.
Details
- Language :
- English
- ISSN :
- 00222461
- Volume :
- 39
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Journal of Materials Science
- Publication Type :
- Academic Journal
- Accession number :
- 15103309
- Full Text :
- https://doi.org/10.1023/B:JMSC.0000025851.15024.ee