Identification of known leaf rust resistance genes in bread wheat cultivars from China.

Leaf rust caused by Puccinia triticina Eriks. (Pt) is one of the most devastating fungal pathogens affecting wheat (Triticum aestivum L.) production worldwide. Deployment of resistant cultivars is the most environmentally friendly approach to control the disease. In this study, thirty-seven wheat lines from the Hubei and Shaanxi provinces in China were evaluated for seedling resistance in the greenhouse using eighteen Pt races. These lines were also tested for slow rusting resistance in the field in the 2014 to 2018 growing seasons. Eleven molecular markers closely associated with known Lr genes were used as part of the postulation process. Seven known Lr genes, 1, 13, 18, 14a, 26, 34 and 46 either singly or in combination were postulated in twenty-five cultivars. Lr1 and Lr26 were the most commonly identified genes detected in thirteen and ten cultivars, respectively. Lr13 and Lr46 were each found in four and five cultivars. Lr34 was present in three cultivars. Lr18 and Lr14a were identified in cultivar Xi'nong 538. Six cultivars displayed slow rusting resistance in the field tests. The resistant cultivars identified in the present study can be used as resistance parents in crosses aimed at pyramiding and the deployment of leaf rust resistance genes in China. [ABSTRACT FROM AUTHOR]