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Diagnostics for ultrashort X-ray pulses using silicon trackers.
- Source :
-
Nuclear Instruments & Methods in Physics Research Section A . Oct2021, Vol. 1014, pN.PAG-N.PAG. 1p. - Publication Year :
- 2021
-
Abstract
- The spectrum of laser–plasma generated X-rays is very important, it characterizes electron dynamics in plasma and is basic for applications. However, the accuracies and efficiencies of existing methods to diagnose the spectrum of laser–plasma based X-ray pulse are not very high, especially in the range of several hundred keV. In this study, a new method based on electron tracks detection to measure the spectrum of laser–plasma produced X-ray pulses is proposed and demonstrated. Laser–plasma generated X-rays are scattered in a multi-pixel silicon tracker. Energies and scattering directions of Compton electrons can be extracted from the response of the detector, and then the spectrum of X-rays can be reconstructed. Simulations indicate that the energy resolution of this method is approximately 20% for X-rays from 200 to 550 keV for a silicon-on-insulator pixel detector with 12 μ m pixel pitch and 500 μ m depletion region thickness. The results of a proof-of-principle experiment based on a Timepix3 detector are also shown. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 01689002
- Volume :
- 1014
- Database :
- Academic Search Index
- Journal :
- Nuclear Instruments & Methods in Physics Research Section A
- Publication Type :
- Academic Journal
- Accession number :
- 152496079
- Full Text :
- https://doi.org/10.1016/j.nima.2021.165754