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Theoretical research for oxidation mechanism of [formula omitted]-Ti: A combination of DFT and ab initio molecular dynamics study.

Authors :
Kang, Qingxin
Wang, Guofeng
Liu, Qing
Sui, Xiaochong
Liu, Yongkang
Chen, Yuqing
Luo, Shuyi
Li, Zhenlun
Source :
Vacuum. Nov2021, Vol. 193, pN.PAG-N.PAG. 1p.
Publication Year :
2021

Abstract

Density functional theory (DFT) and ab initio molecular dynamics (AIMD) calculations are combined to study the α-Ti oxidation mechanism on atomic scale. The most and second stable adsorption site for O atoms on the surface layer is FCC and HCP site, respectively. The most stable adsorption site of subsurface layer is octahedral site. O atoms all gain electrons from adsorbed Ti atoms and the Ti–O bonds are mainly formed by the hybridization between O-p and Ti-d orbitals. At both 303 K and 873 K, AIMD results show that O 2 molecule gradually dissociate into O atoms on α-Ti (0001) surface and then adsorb on the surface. The increase of temperature accelerates the dissociation rate of O 2 molecule. During the formation of Ti–O bond, O and Ti atom gain and lose electrons, respectively. The partial density of states evolution results show that the Ti–O bond is formed by the gradually strengthened hybridization between O-p and Ti-d orbitals. At 303 K, α-Ti (0001) surface can form a dense oxide film. But a discontinuous and loose oxide film is formed at 873 K and O atoms can penetrate into the octahedral and tetrahedral sites of the subsurface layer. • DFT and AIMD were combined to reveal the α-Ti oxidation mechanism. • Adsorption behavior of O atom on surface and subsurface was studied by DFT. • The dynamic dissociation and adsorption process of O 2 was investigated by AIMD. • The temperature effect on the O 2 dissociation behavior was studied by AIMD. • Electronic structure during DFT and AIMD calculation were investigated. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0042207X
Volume :
193
Database :
Academic Search Index
Journal :
Vacuum
Publication Type :
Academic Journal
Accession number :
152514620
Full Text :
https://doi.org/10.1016/j.vacuum.2021.110522