Cite
Storage-Based Built-In Self-Test for Gate-Exhaustive Faults.
MLA
“Storage-Based Built-In Self-Test for Gate-Exhaustive Faults.” IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 40, no. 10, Oct. 2021, pp. 2189–93. EBSCOhost, https://doi.org/10.1109/TCAD.2020.3035133.
APA
Storage-Based Built-In Self-Test for Gate-Exhaustive Faults. (2021). IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 40(10), 2189–2193. https://doi.org/10.1109/TCAD.2020.3035133
Chicago
“Storage-Based Built-In Self-Test for Gate-Exhaustive Faults.” 2021. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 40 (10): 2189–93. doi:10.1109/TCAD.2020.3035133.