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Band offset and electrical properties of ErZO/β-Ga2O3 and GZO/β-Ga2O3 heterojunctions.
- Source :
-
Applied Surface Science . Feb2022:Part A, Vol. 576, pN.PAG-N.PAG. 1p. - Publication Year :
- 2022
-
Abstract
- [Display omitted] • •The band offsets and electrical properties of ErZO/β-Ga 2 O 3 and GZO/β-Ga 2 O 3 heterojunctions were investigated. • •The conduction band offset is 0.88 eV for ErZO and 0.96 eV for GZO, and the corresponding valance band offsets were 0.46 eV and 0.16 eV. • •The barrier height of the W F was 0.05 eV between ErZO and β-Ga 2 O 3 ; and 0.16 eV between GZO and β-Ga 2 O 3. • •The low band offset and barrier height lead to nature ohmic behavior with vertical structure of ErZO/β-Ga 2 O 3 /ErZO and sensitive UV light detection response of the β-Ga 2 O 3 /ErZO/Ti/Au structure. The fabrication of ohmic contacts on wide bandgap semiconductors, such as β-Ga 2 O 3 , is difficult as the scarcity of metals with low-enough work function. The insertion of n+-doped metal oxide layer between metal and the β-Ga 2 O 3 layers are effective for improving the ohmic behaviour. β-Ga 2 O 3 , Erbium doped ZnO (ErZO), and Gallium doped ZnO (GZO) films with high crystallinity were deposited by pulsed laser deposition. The band offsets and electrical properties of ErZO/β-Ga 2 O 3 and GZO/β-Ga 2 O 3 heterojunctions were investigated, which revealed the nested gap (type I) structures. The conduction band offsets were determined to be 0.88 eV for ErZO and 0.96 eV for GZO, and their corresponding valance band offsets were found to be 0.46 eV and 0.16 eV. In addition, the difference of the work functions between ErZO and β-Ga 2 O 3 was 0.05 eV; and 0.16 eV between GZO and β-Ga 2 O 3. Solar blind UV detector having fork electrode structure of as-grown β-Ga 2 O 3 /ErZO/Ti/Au structure showed good ohmic performance and have superior detector performance comparing with the other two electrode structures, which was ascribed to ErZO's low band offset and small work function difference with β-Ga 2 O 3. The present result provides an option for fabricating ohmic contact on β-Ga 2 O 3 without the need for post-growth annealing. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 01694332
- Volume :
- 576
- Database :
- Academic Search Index
- Journal :
- Applied Surface Science
- Publication Type :
- Academic Journal
- Accession number :
- 153866223
- Full Text :
- https://doi.org/10.1016/j.apsusc.2021.151814