Cite
Joint CS Measurement Through Coherent MAC: Exploiting Joint Sparsity of Multiple Phenomena.
MLA
Han, Chengcheng, et al. “Joint CS Measurement Through Coherent MAC: Exploiting Joint Sparsity of Multiple Phenomena.” IEEE Transactions on Vehicular Technology, vol. 71, no. 1, Jan. 2022, pp. 583–94. EBSCOhost, https://doi.org/10.1109/TVT.2021.3129476.
APA
Han, C., Chen, L., & Wang, W. (2022). Joint CS Measurement Through Coherent MAC: Exploiting Joint Sparsity of Multiple Phenomena. IEEE Transactions on Vehicular Technology, 71(1), 583–594. https://doi.org/10.1109/TVT.2021.3129476
Chicago
Han, Chengcheng, Li Chen, and Weidong Wang. 2022. “Joint CS Measurement Through Coherent MAC: Exploiting Joint Sparsity of Multiple Phenomena.” IEEE Transactions on Vehicular Technology 71 (1): 583–94. doi:10.1109/TVT.2021.3129476.