Front Cover: A frequency mapping method for locating functional units inside ICs based on coaxial microscope.

Subjects

Subjects :

*ELECTRONICS
*TECHNOLOGY

Details

Language :

English

ISSN :

00135194

Volume :

58

Issue :

3

Database :

Academic Search Index

Journal :

Electronics Letters (Wiley-Blackwell)

Publication Type :

Academic Journal

Accession number :

154885755

Full Text :

https://doi.org/10.1049/ell2.12373