Cite
Trap-state mapping to model GaN transistors dynamic performance.
MLA
Modolo, Nicola, et al. “Trap-State Mapping to Model GaN Transistors Dynamic Performance.” Scientific Reports, vol. 12, no. 1, Feb. 2022, pp. 1–10. EBSCOhost, https://doi.org/10.1038/s41598-022-05830-7.
APA
Modolo, N., De Santi, C., Minetto, A., Sayadi, L., Prechtl, G., Meneghesso, G., Zanoni, E., & Meneghini, M. (2022). Trap-state mapping to model GaN transistors dynamic performance. Scientific Reports, 12(1), 1–10. https://doi.org/10.1038/s41598-022-05830-7
Chicago
Modolo, Nicola, Carlo De Santi, Andrea Minetto, Luca Sayadi, Gerhard Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, and Matteo Meneghini. 2022. “Trap-State Mapping to Model GaN Transistors Dynamic Performance.” Scientific Reports 12 (1): 1–10. doi:10.1038/s41598-022-05830-7.