Cite
STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging.
MLA
de la Mata, María, and Sergio I. Molina. “STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging.” Nanomaterials (2079-4991), vol. 12, no. 3, Feb. 2022, p. 337. EBSCOhost, https://doi.org/10.3390/nano12030337.
APA
de la Mata, M., & Molina, S. I. (2022). STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging. Nanomaterials (2079-4991), 12(3), 337. https://doi.org/10.3390/nano12030337
Chicago
de la Mata, María, and Sergio I. Molina. 2022. “STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging.” Nanomaterials (2079-4991) 12 (3): 337. doi:10.3390/nano12030337.