Cite
Developing machine learning models with multi-source environmental data to predict wheat yield in China.
MLA
Li, Linchao, et al. “Developing Machine Learning Models with Multi-Source Environmental Data to Predict Wheat Yield in China.” Computers & Electronics in Agriculture, vol. 194, Mar. 2022, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.compag.2022.106790.
APA
Li, L., Wang, B., Feng, P., Li Liu, D., He, Q., Zhang, Y., Wang, Y., Li, S., Lu, X., Yue, C., Li, Y., He, J., Feng, H., Yang, G., & Yu, Q. (2022). Developing machine learning models with multi-source environmental data to predict wheat yield in China. Computers & Electronics in Agriculture, 194, N.PAG. https://doi.org/10.1016/j.compag.2022.106790
Chicago
Li, Linchao, Bin Wang, Puyu Feng, De Li Liu, Qinsi He, Yajie Zhang, Yakai Wang, et al. 2022. “Developing Machine Learning Models with Multi-Source Environmental Data to Predict Wheat Yield in China.” Computers & Electronics in Agriculture 194 (March): N.PAG. doi:10.1016/j.compag.2022.106790.