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IGBT lifetime model considering composite failure modes.
- Source :
-
Materials Science in Semiconductor Processing . Jun2022, Vol. 143, pN.PAG-N.PAG. 1p. - Publication Year :
- 2022
- Subjects :
- *FAILURE mode & effects analysis
*WEIBULL distribution
Subjects
Details
- Language :
- English
- ISSN :
- 13698001
- Volume :
- 143
- Database :
- Academic Search Index
- Journal :
- Materials Science in Semiconductor Processing
- Publication Type :
- Academic Journal
- Accession number :
- 155662099
- Full Text :
- https://doi.org/10.1016/j.mssp.2022.106529