Cite
Front Cover: A frequency mapping method for locating functional units inside ICs based on coaxial microscope.
MLA
Liu, Pengcheng, et al. “Front Cover: A Frequency Mapping Method for Locating Functional Units inside ICs Based on Coaxial Microscope.” Electronics Letters (Wiley-Blackwell), vol. 58, no. 3, Feb. 2022, p. i. EBSCOhost, https://doi.org/10.1049/ell2.12430.
APA
Liu, P., Han, J., Ma, Y., Zhang, F., Wu, Z., Zhu, X., & Cui, Y. (2022). Front Cover: A frequency mapping method for locating functional units inside ICs based on coaxial microscope. Electronics Letters (Wiley-Blackwell), 58(3), i. https://doi.org/10.1049/ell2.12430
Chicago
Liu, Pengcheng, Jianwei Han, Yingqi Ma, Feng Zhang, Zongguo Wu, Xiang Zhu, and Yixin Cui. 2022. “Front Cover: A Frequency Mapping Method for Locating Functional Units inside ICs Based on Coaxial Microscope.” Electronics Letters (Wiley-Blackwell) 58 (3): i. doi:10.1049/ell2.12430.