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Automatically Designing Network-Based Deep Transfer Learning Architectures Based on Genetic Algorithm for In-Situ Tool Condition Monitoring.

Authors :
Liu, Yuekai
Yu, Yaoxiang
Guo, Liang
Gao, Hongli
Tan, Yongwen
Source :
IEEE Transactions on Industrial Electronics. Sep2022, Vol. 69 Issue 9, p9483-9493. 11p.
Publication Year :
2022

Abstract

In-situ tool condition monitoring (in-situ TCM) is vital for metal removal manufacturing which realizes on-machine diagnosis in a real-time manner. The limitation of in-situ TCM based on traditional deep learning lies in several aspects: the requirement of sufficient labeled data of health conditions, the empirically manual designed architecture, and the labor-intensive tuning of hyperparameters. Network-based deep transfer learning (NDTL) partially solves the problem of limited labeled data. However, the time-consuming architecture design and the tuning of hyperparameters also pose a great impact on the schedule of real in-situ TCM projects. In this article, a new NDTL method is proposed, which is automatically designed by the genetic algorithm. A degradation monitoring experiment is conducted employing edge computing devices under multiple working conditions, where the texture of the machined surface is collected during the whole life cycle of milling cutters. The experimental results suggest that the proposed method possesses competitive performance evaluated by both the robustness metrics (e.g., the area under the curve of precision-recall) and the efficiency metrics (e.g., multiply–accumulates), where the trial-and-errors are reduced significantly by the automatic architecture design and the selection of hyperparameters. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
02780046
Volume :
69
Issue :
9
Database :
Academic Search Index
Journal :
IEEE Transactions on Industrial Electronics
Publication Type :
Academic Journal
Accession number :
156273169
Full Text :
https://doi.org/10.1109/TIE.2021.3113004