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A 6T SRAM Based Two-Dimensional Configurable Challenge-Response PUF for Portable Devices.
- Source :
-
IEEE Transactions on Circuits & Systems. Part I: Regular Papers . Jun2022, Vol. 69 Issue 6, p2542-2552. 11p. - Publication Year :
- 2022
-
Abstract
- This work proposes a 2-dimensional programable SRAM-based PUF. The selection of challenge groups, orders, and sequence lengths dominates the responses with challenge-response pairs (CRPs) by order of rows $^{\mathrm {(sequence~\textrm {}length- 1)}} \times $ columns $^{\mathrm {(sequence~\textrm {}length - 1)}}$. The PUF bit cell has split word-lines with vertical and horizontal connections, the bit-lines are placed orthogonally to generate one-bit data with four cells, the entropy source is enriched to 24 transistors. The proposed PUF supports multiple data maps from a single chip. A test chip was fabricated in 65 nm CMOS technology. Under 0.8V and 20 °C (nominal point), the bit error rate reaches 3%. In a single chip, the hamming distance achieves 42.49% within the same group and different orders of challenges, and 47.32% within the different groups of challenges (when the sequence length is 5). The measured inter-hamming distance between chips is improved to 49.47%. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 15498328
- Volume :
- 69
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Circuits & Systems. Part I: Regular Papers
- Publication Type :
- Periodical
- Accession number :
- 157191483
- Full Text :
- https://doi.org/10.1109/TCSI.2022.3156983