Cite
GEPDFs: Path Delay Faults Based on Two-Cycle Gate-Exhaustive Faults.
MLA
“GEPDFs: Path Delay Faults Based on Two-Cycle Gate-Exhaustive Faults.” IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 41, no. 7, July 2022, pp. 2315–22. EBSCOhost, https://doi.org/10.1109/TCAD.2021.3105913.
APA
GEPDFs: Path Delay Faults Based on Two-Cycle Gate-Exhaustive Faults. (2022). IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 41(7), 2315–2322. https://doi.org/10.1109/TCAD.2021.3105913
Chicago
“GEPDFs: Path Delay Faults Based on Two-Cycle Gate-Exhaustive Faults.” 2022. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 41 (7): 2315–22. doi:10.1109/TCAD.2021.3105913.