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BETTER PERFORMANCE, HIGHER RELIABILITY, MORE SECURITY: RESEARCH HIGHLIGHTS FROM THE CENTER FOR ADVANCED ELECTRONICS THROUGH MACHINE LEARNING.

Authors :
Aysu, Aydin
Xu Chen
Davis, W. Rhett
Sung Kyu Lim
Franzon, Paul
Swaminathan, Madhavan
Rosenbaum, Elyse
Source :
Electronic Device Failure Analysis. May2022, Vol. 24 Issue 2, p34-36. 3p.
Publication Year :
2022

Abstract

The article reports that The Center for Advanced Electronics through Machine Learning, or CAEML, is an IndustryUniversity Cooperative Research Center (IUCRC) supported by the National Science Foundation. The IUCRC program supports pre-competitive research that is of high interest to industry. CAEML's research mission is to utilize machine learning for the design of optimized microelectronic circuits and systems and to increase the efficiency of electronic design automation.

Details

Language :
English
ISSN :
15370755
Volume :
24
Issue :
2
Database :
Academic Search Index
Journal :
Electronic Device Failure Analysis
Publication Type :
Academic Journal
Accession number :
157580521